Kyungmin Park | af3d11c | 2007-09-10 17:15:14 +0900 | [diff] [blame] | 1 | /* |
| 2 | * linux/include/linux/mtd/bbm.h |
| 3 | * |
| 4 | * NAND family Bad Block Management (BBM) header file |
| 5 | * - Bad Block Table (BBT) implementation |
| 6 | * |
| 7 | * Copyright (c) 2005-2007 Samsung Electronics |
| 8 | * Kyungmin Park <kyungmin.park@samsung.com> |
| 9 | * |
| 10 | * Copyright (c) 2000-2005 |
| 11 | * Thomas Gleixner <tglx@linuxtronix.de> |
| 12 | * |
| 13 | * This program is free software; you can redistribute it and/or modify |
Christian Hitz | b8a6b37 | 2011-10-12 09:32:02 +0200 | [diff] [blame] | 14 | * it under the terms of the GNU General Public License as published by |
| 15 | * the Free Software Foundation; either version 2 of the License, or |
| 16 | * (at your option) any later version. |
| 17 | * |
| 18 | * This program is distributed in the hope that it will be useful, |
| 19 | * but WITHOUT ANY WARRANTY; without even the implied warranty of |
| 20 | * MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the |
| 21 | * GNU General Public License for more details. |
| 22 | * |
| 23 | * You should have received a copy of the GNU General Public License |
| 24 | * along with this program; if not, write to the Free Software |
| 25 | * Foundation, Inc., 51 Franklin St, Fifth Floor, Boston, MA 02110-1301 USA |
| 26 | * |
Kyungmin Park | af3d11c | 2007-09-10 17:15:14 +0900 | [diff] [blame] | 27 | */ |
| 28 | #ifndef __LINUX_MTD_BBM_H |
| 29 | #define __LINUX_MTD_BBM_H |
| 30 | |
| 31 | /* The maximum number of NAND chips in an array */ |
Wolfgang Grandegger | 0302550 | 2009-01-16 18:55:54 +0100 | [diff] [blame] | 32 | #ifndef CONFIG_SYS_NAND_MAX_CHIPS |
| 33 | #define CONFIG_SYS_NAND_MAX_CHIPS 1 |
Kyungmin Park | af3d11c | 2007-09-10 17:15:14 +0900 | [diff] [blame] | 34 | #endif |
| 35 | |
| 36 | /** |
| 37 | * struct nand_bbt_descr - bad block table descriptor |
| 38 | * @param options options for this descriptor |
| 39 | * @param pages the page(s) where we find the bbt, used with |
Wolfgang Denk | a1be476 | 2008-05-20 16:00:29 +0200 | [diff] [blame] | 40 | * option BBT_ABSPAGE when bbt is searched, |
| 41 | * then we store the found bbts pages here. |
Kyungmin Park | af3d11c | 2007-09-10 17:15:14 +0900 | [diff] [blame] | 42 | * Its an array and supports up to 8 chips now |
| 43 | * @param offs offset of the pattern in the oob area of the page |
| 44 | * @param veroffs offset of the bbt version counter in the oob are of the page |
| 45 | * @param version version read from the bbt page during scan |
| 46 | * @param len length of the pattern, if 0 no pattern check is performed |
| 47 | * @param maxblocks maximum number of blocks to search for a bbt. This number of |
| 48 | * blocks is reserved at the end of the device |
| 49 | * where the tables are written. |
| 50 | * @param reserved_block_code if non-0, this pattern denotes a reserved |
| 51 | * (rather than bad) block in the stored bbt |
| 52 | * @param pattern pattern to identify bad block table or factory marked |
| 53 | * good / bad blocks, can be NULL, if len = 0 |
| 54 | * |
| 55 | * Descriptor for the bad block table marker and the descriptor for the |
| 56 | * pattern which identifies good and bad blocks. The assumption is made |
| 57 | * that the pattern and the version count are always located in the oob area |
| 58 | * of the first block. |
| 59 | */ |
| 60 | struct nand_bbt_descr { |
| 61 | int options; |
Wolfgang Grandegger | 0302550 | 2009-01-16 18:55:54 +0100 | [diff] [blame] | 62 | int pages[CONFIG_SYS_NAND_MAX_CHIPS]; |
Kyungmin Park | af3d11c | 2007-09-10 17:15:14 +0900 | [diff] [blame] | 63 | int offs; |
| 64 | int veroffs; |
Wolfgang Grandegger | 0302550 | 2009-01-16 18:55:54 +0100 | [diff] [blame] | 65 | uint8_t version[CONFIG_SYS_NAND_MAX_CHIPS]; |
Kyungmin Park | af3d11c | 2007-09-10 17:15:14 +0900 | [diff] [blame] | 66 | int len; |
| 67 | int maxblocks; |
| 68 | int reserved_block_code; |
| 69 | uint8_t *pattern; |
| 70 | }; |
| 71 | |
| 72 | /* Options for the bad block table descriptors */ |
| 73 | |
| 74 | /* The number of bits used per block in the bbt on the device */ |
| 75 | #define NAND_BBT_NRBITS_MSK 0x0000000F |
| 76 | #define NAND_BBT_1BIT 0x00000001 |
| 77 | #define NAND_BBT_2BIT 0x00000002 |
| 78 | #define NAND_BBT_4BIT 0x00000004 |
| 79 | #define NAND_BBT_8BIT 0x00000008 |
| 80 | /* The bad block table is in the last good block of the device */ |
| 81 | #define NAND_BBT_LASTBLOCK 0x00000010 |
| 82 | /* The bbt is at the given page, else we must scan for the bbt */ |
| 83 | #define NAND_BBT_ABSPAGE 0x00000020 |
| 84 | /* The bbt is at the given page, else we must scan for the bbt */ |
| 85 | #define NAND_BBT_SEARCH 0x00000040 |
| 86 | /* bbt is stored per chip on multichip devices */ |
| 87 | #define NAND_BBT_PERCHIP 0x00000080 |
| 88 | /* bbt has a version counter at offset veroffs */ |
| 89 | #define NAND_BBT_VERSION 0x00000100 |
Christian Hitz | b8a6b37 | 2011-10-12 09:32:02 +0200 | [diff] [blame] | 90 | /* Create a bbt if none exists */ |
Kyungmin Park | af3d11c | 2007-09-10 17:15:14 +0900 | [diff] [blame] | 91 | #define NAND_BBT_CREATE 0x00000200 |
| 92 | /* Search good / bad pattern through all pages of a block */ |
| 93 | #define NAND_BBT_SCANALLPAGES 0x00000400 |
| 94 | /* Scan block empty during good / bad block scan */ |
| 95 | #define NAND_BBT_SCANEMPTY 0x00000800 |
| 96 | /* Write bbt if neccecary */ |
| 97 | #define NAND_BBT_WRITE 0x00001000 |
| 98 | /* Read and write back block contents when writing bbt */ |
| 99 | #define NAND_BBT_SAVECONTENT 0x00002000 |
| 100 | /* Search good / bad pattern on the first and the second page */ |
| 101 | #define NAND_BBT_SCAN2NDPAGE 0x00004000 |
Christian Hitz | b8a6b37 | 2011-10-12 09:32:02 +0200 | [diff] [blame] | 102 | /* Search good / bad pattern on the last page of the eraseblock */ |
| 103 | #define NAND_BBT_SCANLASTPAGE 0x00008000 |
| 104 | /* Chip stores bad block marker on BOTH 1st and 6th bytes of OOB */ |
| 105 | #define NAND_BBT_SCANBYTE1AND6 0x00100000 |
| 106 | /* The nand_bbt_descr was created dynamicaly and must be freed */ |
| 107 | #define NAND_BBT_DYNAMICSTRUCT 0x00200000 |
Christian Hitz | 24e6ea4 | 2011-10-12 09:32:04 +0200 | [diff] [blame] | 108 | /* The bad block table does not OOB for marker */ |
| 109 | #define NAND_BBT_NO_OOB 0x00400000 |
Kyungmin Park | af3d11c | 2007-09-10 17:15:14 +0900 | [diff] [blame] | 110 | |
| 111 | /* The maximum number of blocks to scan for a bbt */ |
| 112 | #define NAND_BBT_SCAN_MAXBLOCKS 4 |
| 113 | |
| 114 | /* |
| 115 | * Constants for oob configuration |
| 116 | */ |
| 117 | #define ONENAND_BADBLOCK_POS 0 |
| 118 | |
Kyungmin Park | 5d7a01c | 2008-08-19 08:42:53 +0900 | [diff] [blame] | 119 | /* |
| 120 | * Bad block scanning errors |
| 121 | */ |
| 122 | #define ONENAND_BBT_READ_ERROR 1 |
| 123 | #define ONENAND_BBT_READ_ECC_ERROR 2 |
| 124 | #define ONENAND_BBT_READ_FATAL_ERROR 4 |
| 125 | |
Kyungmin Park | af3d11c | 2007-09-10 17:15:14 +0900 | [diff] [blame] | 126 | /** |
| 127 | * struct bbt_info - [GENERIC] Bad Block Table data structure |
| 128 | * @param bbt_erase_shift [INTERN] number of address bits in a bbt entry |
| 129 | * @param badblockpos [INTERN] position of the bad block marker in the oob area |
| 130 | * @param bbt [INTERN] bad block table pointer |
| 131 | * @param badblock_pattern [REPLACEABLE] bad block scan pattern used for initial bad block scan |
| 132 | * @param priv [OPTIONAL] pointer to private bbm date |
| 133 | */ |
| 134 | struct bbm_info { |
| 135 | int bbt_erase_shift; |
| 136 | int badblockpos; |
| 137 | int options; |
| 138 | |
| 139 | uint8_t *bbt; |
| 140 | |
| 141 | int (*isbad_bbt) (struct mtd_info * mtd, loff_t ofs, int allowbbt); |
| 142 | |
| 143 | /* TODO Add more NAND specific fileds */ |
| 144 | struct nand_bbt_descr *badblock_pattern; |
| 145 | |
| 146 | void *priv; |
| 147 | }; |
| 148 | |
| 149 | /* OneNAND BBT interface */ |
| 150 | extern int onenand_scan_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd); |
| 151 | extern int onenand_default_bbt (struct mtd_info *mtd); |
| 152 | |
| 153 | #endif /* __LINUX_MTD_BBM_H */ |