Kyungmin Park | af3d11c | 2007-09-10 17:15:14 +0900 | [diff] [blame^] | 1 | /* |
| 2 | * linux/include/linux/mtd/bbm.h |
| 3 | * |
| 4 | * NAND family Bad Block Management (BBM) header file |
| 5 | * - Bad Block Table (BBT) implementation |
| 6 | * |
| 7 | * Copyright (c) 2005-2007 Samsung Electronics |
| 8 | * Kyungmin Park <kyungmin.park@samsung.com> |
| 9 | * |
| 10 | * Copyright (c) 2000-2005 |
| 11 | * Thomas Gleixner <tglx@linuxtronix.de> |
| 12 | * |
| 13 | * This program is free software; you can redistribute it and/or modify |
| 14 | * it under the terms of the GNU General Public License version 2 as |
| 15 | * published by the Free Software Foundation. |
| 16 | */ |
| 17 | #ifndef __LINUX_MTD_BBM_H |
| 18 | #define __LINUX_MTD_BBM_H |
| 19 | |
| 20 | /* The maximum number of NAND chips in an array */ |
| 21 | #ifndef NAND_MAX_CHIPS |
| 22 | #define NAND_MAX_CHIPS 8 |
| 23 | #endif |
| 24 | |
| 25 | /** |
| 26 | * struct nand_bbt_descr - bad block table descriptor |
| 27 | * @param options options for this descriptor |
| 28 | * @param pages the page(s) where we find the bbt, used with |
| 29 | * option BBT_ABSPAGE when bbt is searched, |
| 30 | * then we store the found bbts pages here. |
| 31 | * Its an array and supports up to 8 chips now |
| 32 | * @param offs offset of the pattern in the oob area of the page |
| 33 | * @param veroffs offset of the bbt version counter in the oob are of the page |
| 34 | * @param version version read from the bbt page during scan |
| 35 | * @param len length of the pattern, if 0 no pattern check is performed |
| 36 | * @param maxblocks maximum number of blocks to search for a bbt. This number of |
| 37 | * blocks is reserved at the end of the device |
| 38 | * where the tables are written. |
| 39 | * @param reserved_block_code if non-0, this pattern denotes a reserved |
| 40 | * (rather than bad) block in the stored bbt |
| 41 | * @param pattern pattern to identify bad block table or factory marked |
| 42 | * good / bad blocks, can be NULL, if len = 0 |
| 43 | * |
| 44 | * Descriptor for the bad block table marker and the descriptor for the |
| 45 | * pattern which identifies good and bad blocks. The assumption is made |
| 46 | * that the pattern and the version count are always located in the oob area |
| 47 | * of the first block. |
| 48 | */ |
| 49 | struct nand_bbt_descr { |
| 50 | int options; |
| 51 | int pages[NAND_MAX_CHIPS]; |
| 52 | int offs; |
| 53 | int veroffs; |
| 54 | uint8_t version[NAND_MAX_CHIPS]; |
| 55 | int len; |
| 56 | int maxblocks; |
| 57 | int reserved_block_code; |
| 58 | uint8_t *pattern; |
| 59 | }; |
| 60 | |
| 61 | /* Options for the bad block table descriptors */ |
| 62 | |
| 63 | /* The number of bits used per block in the bbt on the device */ |
| 64 | #define NAND_BBT_NRBITS_MSK 0x0000000F |
| 65 | #define NAND_BBT_1BIT 0x00000001 |
| 66 | #define NAND_BBT_2BIT 0x00000002 |
| 67 | #define NAND_BBT_4BIT 0x00000004 |
| 68 | #define NAND_BBT_8BIT 0x00000008 |
| 69 | /* The bad block table is in the last good block of the device */ |
| 70 | #define NAND_BBT_LASTBLOCK 0x00000010 |
| 71 | /* The bbt is at the given page, else we must scan for the bbt */ |
| 72 | #define NAND_BBT_ABSPAGE 0x00000020 |
| 73 | /* The bbt is at the given page, else we must scan for the bbt */ |
| 74 | #define NAND_BBT_SEARCH 0x00000040 |
| 75 | /* bbt is stored per chip on multichip devices */ |
| 76 | #define NAND_BBT_PERCHIP 0x00000080 |
| 77 | /* bbt has a version counter at offset veroffs */ |
| 78 | #define NAND_BBT_VERSION 0x00000100 |
| 79 | /* Create a bbt if none axists */ |
| 80 | #define NAND_BBT_CREATE 0x00000200 |
| 81 | /* Search good / bad pattern through all pages of a block */ |
| 82 | #define NAND_BBT_SCANALLPAGES 0x00000400 |
| 83 | /* Scan block empty during good / bad block scan */ |
| 84 | #define NAND_BBT_SCANEMPTY 0x00000800 |
| 85 | /* Write bbt if neccecary */ |
| 86 | #define NAND_BBT_WRITE 0x00001000 |
| 87 | /* Read and write back block contents when writing bbt */ |
| 88 | #define NAND_BBT_SAVECONTENT 0x00002000 |
| 89 | /* Search good / bad pattern on the first and the second page */ |
| 90 | #define NAND_BBT_SCAN2NDPAGE 0x00004000 |
| 91 | |
| 92 | /* The maximum number of blocks to scan for a bbt */ |
| 93 | #define NAND_BBT_SCAN_MAXBLOCKS 4 |
| 94 | |
| 95 | /* |
| 96 | * Constants for oob configuration |
| 97 | */ |
| 98 | #define ONENAND_BADBLOCK_POS 0 |
| 99 | |
| 100 | /** |
| 101 | * struct bbt_info - [GENERIC] Bad Block Table data structure |
| 102 | * @param bbt_erase_shift [INTERN] number of address bits in a bbt entry |
| 103 | * @param badblockpos [INTERN] position of the bad block marker in the oob area |
| 104 | * @param bbt [INTERN] bad block table pointer |
| 105 | * @param badblock_pattern [REPLACEABLE] bad block scan pattern used for initial bad block scan |
| 106 | * @param priv [OPTIONAL] pointer to private bbm date |
| 107 | */ |
| 108 | struct bbm_info { |
| 109 | int bbt_erase_shift; |
| 110 | int badblockpos; |
| 111 | int options; |
| 112 | |
| 113 | uint8_t *bbt; |
| 114 | |
| 115 | int (*isbad_bbt) (struct mtd_info * mtd, loff_t ofs, int allowbbt); |
| 116 | |
| 117 | /* TODO Add more NAND specific fileds */ |
| 118 | struct nand_bbt_descr *badblock_pattern; |
| 119 | |
| 120 | void *priv; |
| 121 | }; |
| 122 | |
| 123 | /* OneNAND BBT interface */ |
| 124 | extern int onenand_scan_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd); |
| 125 | extern int onenand_default_bbt (struct mtd_info *mtd); |
| 126 | |
| 127 | #endif /* __LINUX_MTD_BBM_H */ |