| /* SPDX-License-Identifier: GPL-2.0+ */ |
| /* |
| * Copyright (c) 2013 Google, Inc. |
| */ |
| |
| #ifndef __TEST_TEST_H |
| #define __TEST_TEST_H |
| |
| #include <malloc.h> |
| #include <linux/bitops.h> |
| |
| /* |
| * struct unit_test_state - Entire state of test system |
| * |
| * @fail_count: Number of tests that failed |
| * @start: Store the starting mallinfo when doing leak test |
| * @of_live: true to use livetree if available, false to use flattree |
| * @of_root: Record of the livetree root node (used for setting up tests) |
| * @root: Root device |
| * @testdev: Test device |
| * @force_fail_alloc: Force all memory allocs to fail |
| * @skip_post_probe: Skip uclass post-probe processing |
| * @fdt_chksum: crc8 of the device tree contents |
| * @fdt_copy: Copy of the device tree |
| * @fdt_size: Size of the device-tree copy |
| * @runs_per_test: Number of times to run each test (typically 1) |
| * @expect_str: Temporary string used to hold expected string value |
| * @actual_str: Temporary string used to hold actual string value |
| */ |
| struct unit_test_state { |
| int fail_count; |
| struct mallinfo start; |
| struct device_node *of_root; |
| bool of_live; |
| struct udevice *root; |
| struct udevice *testdev; |
| int force_fail_alloc; |
| int skip_post_probe; |
| uint fdt_chksum; |
| void *fdt_copy; |
| uint fdt_size; |
| int runs_per_test; |
| char expect_str[512]; |
| char actual_str[512]; |
| }; |
| |
| /* Test flags for each test */ |
| enum { |
| UT_TESTF_SCAN_PDATA = BIT(0), /* test needs platform data */ |
| UT_TESTF_PROBE_TEST = BIT(1), /* probe test uclass */ |
| UT_TESTF_SCAN_FDT = BIT(2), /* scan device tree */ |
| UT_TESTF_FLAT_TREE = BIT(3), /* test needs flat DT */ |
| UT_TESTF_LIVE_TREE = BIT(4), /* needs live device tree */ |
| UT_TESTF_CONSOLE_REC = BIT(5), /* needs console recording */ |
| /* do extra driver model init and uninit */ |
| UT_TESTF_DM = BIT(6), |
| /* live or flat device tree, but not both in the same executable */ |
| UT_TESTF_LIVE_OR_FLAT = BIT(7), |
| }; |
| |
| /** |
| * struct unit_test - Information about a unit test |
| * |
| * @name: Name of test |
| * @func: Function to call to perform test |
| * @flags: Flags indicated pre-conditions for test |
| */ |
| struct unit_test { |
| const char *file; |
| const char *name; |
| int (*func)(struct unit_test_state *state); |
| int flags; |
| }; |
| |
| /** |
| * UNIT_TEST() - create linker generated list entry for unit a unit test |
| * |
| * The macro UNIT_TEST() is used to create a linker generated list entry. These |
| * list entries are enumerate tests that can be execute using the ut command. |
| * The list entries are used both by the implementation of the ut command as |
| * well as in a related Python test. |
| * |
| * For Python testing the subtests are collected in Python function |
| * generate_ut_subtest() by applying a regular expression to the lines of file |
| * u-boot.sym. The list entries have to follow strict naming conventions to be |
| * matched by the expression. |
| * |
| * Use UNIT_TEST(foo_test_bar, _flags, foo_test) for a test bar in test suite |
| * foo that can be executed via command 'ut foo bar' and is implemented in |
| * function foo_test_bar(). |
| * |
| * @_name: concatenation of name of the test suite, "_test_", and the name |
| * of the test |
| * @_flags: an integer field that can be evaluated by the test suite |
| * implementation |
| * @_suite: name of the test suite concatenated with "_test" |
| */ |
| #define UNIT_TEST(_name, _flags, _suite) \ |
| ll_entry_declare(struct unit_test, _name, ut_ ## _suite) = { \ |
| .file = __FILE__, \ |
| .name = #_name, \ |
| .flags = _flags, \ |
| .func = _name, \ |
| } |
| |
| /* Get the start of a list of unit tests for a particular suite */ |
| #define UNIT_TEST_SUITE_START(_suite) \ |
| ll_entry_start(struct unit_test, ut_ ## _suite) |
| #define UNIT_TEST_SUITE_COUNT(_suite) \ |
| ll_entry_count(struct unit_test, ut_ ## _suite) |
| |
| /* Use ! and ~ so that all tests will be sorted between these two values */ |
| #define UNIT_TEST_ALL_START() ll_entry_start(struct unit_test, ut_!) |
| #define UNIT_TEST_ALL_END() ll_entry_start(struct unit_test, ut_~) |
| #define UNIT_TEST_ALL_COUNT() (UNIT_TEST_ALL_END() - UNIT_TEST_ALL_START()) |
| |
| /* Sizes for devres tests */ |
| enum { |
| TEST_DEVRES_SIZE = 100, |
| TEST_DEVRES_COUNT = 10, |
| TEST_DEVRES_TOTAL = TEST_DEVRES_SIZE * TEST_DEVRES_COUNT, |
| |
| /* A few different sizes */ |
| TEST_DEVRES_SIZE2 = 15, |
| TEST_DEVRES_SIZE3 = 37, |
| }; |
| |
| /** |
| * testbus_get_clear_removed() - Test function to obtain removed device |
| * |
| * This is used in testbus to find out which device was removed. Calling this |
| * function returns a pointer to the device and then clears it back to NULL, so |
| * that a future test can check it. |
| */ |
| struct udevice *testbus_get_clear_removed(void); |
| |
| static inline void arch_reset_for_test(void) |
| { |
| #ifdef CONFIG_SANDBOX |
| #include <asm/state.h> |
| |
| state_reset_for_test(state_get_current()); |
| #endif |
| } |
| |
| #endif /* __TEST_TEST_H */ |