include/test/test.h - filogic/uboot - Gitiles

 /* SPDX-License-Identifier: GPL-2.0+ */
 /*
  * Copyright (c) 2013 Google, Inc.
  */

 #ifndef __TEST_TEST_H
 #define __TEST_TEST_H

 #include <malloc.h>
 #include <linux/bitops.h>

 /*
  * struct unit_test_state - Entire state of test system
  *
  * @fail_count: Number of tests that failed
  * @skip_count: Number of tests that were skipped
  * @start: Store the starting mallinfo when doing leak test
  * @of_live: true to use livetree if available, false to use flattree
  * @of_root: Record of the livetree root node (used for setting up tests)
  * @root: Root device
  * @testdev: Test device
  * @force_fail_alloc: Force all memory allocs to fail
  * @skip_post_probe: Skip uclass post-probe processing
  * @fdt_chksum: crc8 of the device tree contents
  * @fdt_copy: Copy of the device tree
  * @fdt_size: Size of the device-tree copy
  * @other_fdt: Buffer for the other FDT (UT_TESTF_OTHER_FDT)
  * @other_fdt_size: Size of the other FDT (UT_TESTF_OTHER_FDT)
  * @of_other: Live tree for the other FDT
  * @runs_per_test: Number of times to run each test (typically 1)
  * @force_run: true to run tests marked with the UT_TESTF_MANUAL flag
  * @expect_str: Temporary string used to hold expected string value
  * @actual_str: Temporary string used to hold actual string value
  */
 struct unit_test_state {
 	int fail_count;
 	int skip_count;
 	struct mallinfo start;
 	struct device_node *of_root;
 	bool of_live;
 	struct udevice *root;
 	struct udevice *testdev;
 	int force_fail_alloc;
 	int skip_post_probe;
 	uint fdt_chksum;
 	void *fdt_copy;
 	uint fdt_size;
 	void *other_fdt;
 	int other_fdt_size;
 	struct device_node *of_other;
 	int runs_per_test;
 	bool force_run;
 	char expect_str[512];
 	char actual_str[512];
 };

 /* Test flags for each test */
 enum {
 	UT_TESTF_SCAN_PDATA	= BIT(0),	/* test needs platform data */
 	UT_TESTF_PROBE_TEST	= BIT(1),	/* probe test uclass */
 	UT_TESTF_SCAN_FDT	= BIT(2),	/* scan device tree */
 	UT_TESTF_FLAT_TREE	= BIT(3),	/* test needs flat DT */
 	UT_TESTF_LIVE_TREE	= BIT(4),	/* needs live device tree */
 	UT_TESTF_CONSOLE_REC	= BIT(5),	/* needs console recording */
 	/* do extra driver model init and uninit */
 	UT_TESTF_DM		= BIT(6),
 	UT_TESTF_OTHER_FDT	= BIT(7),	/* read in other device tree */
 	/*
 	 * Only run if explicitly requested with 'ut -f <suite> <test>'. The
 	 * test name must end in "_norun" so that pytest detects this also,
 	 * since it cannot access the flags.
 	 */
 	UT_TESTF_MANUAL		= BIT(8),
 	UT_TESTF_ETH_BOOTDEV	= BIT(9),	/* enable Ethernet bootdevs */
 };

 /**
  * struct unit_test - Information about a unit test
  *
  * @name: Name of test
  * @func: Function to call to perform test
  * @flags: Flags indicated pre-conditions for test
  */
 struct unit_test {
 	const char *file;
 	const char *name;
 	int (*func)(struct unit_test_state *state);
 	int flags;
 };

 /**
  * UNIT_TEST() - create linker generated list entry for unit a unit test
  *
  * The macro UNIT_TEST() is used to create a linker generated list entry. These
  * list entries are enumerate tests that can be execute using the ut command.
  * The list entries are used both by the implementation of the ut command as
  * well as in a related Python test.
  *
  * For Python testing the subtests are collected in Python function
  * generate_ut_subtest() by applying a regular expression to the lines of file
  * u-boot.sym. The list entries have to follow strict naming conventions to be
  * matched by the expression.
  *
  * Use UNIT_TEST(foo_test_bar, _flags, foo_test) for a test bar in test suite
  * foo that can be executed via command 'ut foo bar' and is implemented in
  * function foo_test_bar().
  *
  * @_name:	concatenation of name of the test suite, "_test_", and the name
  *		of the test
  * @_flags:	an integer field that can be evaluated by the test suite
  *		implementation
  * @_suite:	name of the test suite concatenated with "_test"
  */
 #define UNIT_TEST(_name, _flags, _suite)				\
 	ll_entry_declare(struct unit_test, _name, ut_ ## _suite) = {	\
 		.file = __FILE__,					\
 		.name = #_name,						\
 		.flags = _flags,					\
 		.func = _name,						\
 	}

 /* Get the start of a list of unit tests for a particular suite */
 #define UNIT_TEST_SUITE_START(_suite) \
 	ll_entry_start(struct unit_test, ut_ ## _suite)
 #define UNIT_TEST_SUITE_COUNT(_suite) \
 	ll_entry_count(struct unit_test, ut_ ## _suite)

 /* Use ! and ~ so that all tests will be sorted between these two values */
 #define UNIT_TEST_ALL_START()	ll_entry_start(struct unit_test, ut_!)
 #define UNIT_TEST_ALL_END()	ll_entry_start(struct unit_test, ut_~)
 #define UNIT_TEST_ALL_COUNT()	(UNIT_TEST_ALL_END() - UNIT_TEST_ALL_START())

 /* Sizes for devres tests */
 enum {
 	TEST_DEVRES_SIZE	= 100,
 	TEST_DEVRES_COUNT	= 10,
 	TEST_DEVRES_TOTAL	= TEST_DEVRES_SIZE * TEST_DEVRES_COUNT,

 	/* A few different sizes */
 	TEST_DEVRES_SIZE2	= 15,
 	TEST_DEVRES_SIZE3	= 37,
 };

 /**
  * testbus_get_clear_removed() - Test function to obtain removed device
  *
  * This is used in testbus to find out which device was removed. Calling this
  * function returns a pointer to the device and then clears it back to NULL, so
  * that a future test can check it.
  */
 struct udevice *testbus_get_clear_removed(void);

 #ifdef CONFIG_SANDBOX
 #include <asm/state.h>
 #include <asm/test.h>
 #endif

 static inline void arch_reset_for_test(void)
 {
 #ifdef CONFIG_SANDBOX
 	state_reset_for_test(state_get_current());
 #endif
 }
 static inline int test_load_other_fdt(struct unit_test_state *uts)
 {
 	int ret = 0;
 #ifdef CONFIG_SANDBOX
 	ret = sandbox_load_other_fdt(&uts->other_fdt, &uts->other_fdt_size);
 #endif
 	return ret;
 }

 /**
  * Control skipping of time delays
  *
  * Some tests have unnecessay time delays (e.g. USB). Allow these to be
  * skipped to speed up testing
  *
  * @param skip_delays	true to skip delays from now on, false to honour delay
  *			requests
  */
 static inline void test_set_skip_delays(bool skip_delays)
 {
 #ifdef CONFIG_SANDBOX
 	state_set_skip_delays(skip_delays);
 #endif
 }

 /**
  * test_set_eth_enable() - Enable / disable Ethernet
  *
  * Allows control of whether Ethernet packets are actually send/received
  *
  * @enable: true to enable Ethernet, false to disable
  */
 static inline void test_set_eth_enable(bool enable)
 {
 #ifdef CONFIG_SANDBOX
 	sandbox_set_eth_enable(enable);
 #endif
 }

 /* Allow ethernet to be disabled for testing purposes */
 static inline bool test_eth_enabled(void)
 {
 	bool enabled = true;

 #ifdef CONFIG_SANDBOX
 	enabled = sandbox_eth_enabled();
 #endif
 	return enabled;
 }

 /* Allow ethernet bootdev to be ignored for testing purposes */
 static inline bool test_eth_bootdev_enabled(void)
 {
 	bool enabled = true;

 #ifdef CONFIG_SANDBOX
 	enabled = sandbox_eth_enabled();
 #endif
 	return enabled;
 }

 #endif /* __TEST_TEST_H */
	/* SPDX-License-Identifier: GPL-2.0+ */
	/*
	* Copyright (c) 2013 Google, Inc.
	*/

	#ifndef __TEST_TEST_H
	#define __TEST_TEST_H

	#include <malloc.h>
	#include <linux/bitops.h>

	/*
	* struct unit_test_state - Entire state of test system
	*
	* @fail_count: Number of tests that failed
	* @skip_count: Number of tests that were skipped
	* @start: Store the starting mallinfo when doing leak test
	* @of_live: true to use livetree if available, false to use flattree
	* @of_root: Record of the livetree root node (used for setting up tests)
	* @root: Root device
	* @testdev: Test device
	* @force_fail_alloc: Force all memory allocs to fail
	* @skip_post_probe: Skip uclass post-probe processing
	* @fdt_chksum: crc8 of the device tree contents
	* @fdt_copy: Copy of the device tree
	* @fdt_size: Size of the device-tree copy
	* @other_fdt: Buffer for the other FDT (UT_TESTF_OTHER_FDT)
	* @other_fdt_size: Size of the other FDT (UT_TESTF_OTHER_FDT)
	* @of_other: Live tree for the other FDT
	* @runs_per_test: Number of times to run each test (typically 1)
	* @force_run: true to run tests marked with the UT_TESTF_MANUAL flag
	* @expect_str: Temporary string used to hold expected string value
	* @actual_str: Temporary string used to hold actual string value
	*/
	struct unit_test_state {
	int fail_count;
	int skip_count;
	struct mallinfo start;
	struct device_node *of_root;
	bool of_live;
	struct udevice *root;
	struct udevice *testdev;
	int force_fail_alloc;
	int skip_post_probe;
	uint fdt_chksum;
	void *fdt_copy;
	uint fdt_size;
	void *other_fdt;
	int other_fdt_size;
	struct device_node *of_other;
	int runs_per_test;
	bool force_run;
	char expect_str[512];
	char actual_str[512];
	};

	/* Test flags for each test */
	enum {
	UT_TESTF_SCAN_PDATA = BIT(0), /* test needs platform data */
	UT_TESTF_PROBE_TEST = BIT(1), /* probe test uclass */
	UT_TESTF_SCAN_FDT = BIT(2), /* scan device tree */
	UT_TESTF_FLAT_TREE = BIT(3), /* test needs flat DT */
	UT_TESTF_LIVE_TREE = BIT(4), /* needs live device tree */
	UT_TESTF_CONSOLE_REC = BIT(5), /* needs console recording */
	/* do extra driver model init and uninit */
	UT_TESTF_DM = BIT(6),
	UT_TESTF_OTHER_FDT = BIT(7), /* read in other device tree */
	/*
	* Only run if explicitly requested with 'ut -f <suite> <test>'. The
	* test name must end in "_norun" so that pytest detects this also,
	* since it cannot access the flags.
	*/
	UT_TESTF_MANUAL = BIT(8),
	UT_TESTF_ETH_BOOTDEV = BIT(9), /* enable Ethernet bootdevs */
	};

	/**
	* struct unit_test - Information about a unit test
	*
	* @name: Name of test
	* @func: Function to call to perform test
	* @flags: Flags indicated pre-conditions for test
	*/
	struct unit_test {
	const char *file;
	const char *name;
	int (func)(struct unit_test_state state);
	int flags;
	};

	/**
	* UNIT_TEST() - create linker generated list entry for unit a unit test
	*
	* The macro UNIT_TEST() is used to create a linker generated list entry. These
	* list entries are enumerate tests that can be execute using the ut command.
	* The list entries are used both by the implementation of the ut command as
	* well as in a related Python test.
	*
	* For Python testing the subtests are collected in Python function
	* generate_ut_subtest() by applying a regular expression to the lines of file
	* u-boot.sym. The list entries have to follow strict naming conventions to be
	* matched by the expression.
	*
	* Use UNIT_TEST(foo_test_bar, _flags, foo_test) for a test bar in test suite
	* foo that can be executed via command 'ut foo bar' and is implemented in
	* function foo_test_bar().
	*
	* @_name: concatenation of name of the test suite, "_test_", and the name
	* of the test
	* @_flags: an integer field that can be evaluated by the test suite
	* implementation
	* @_suite: name of the test suite concatenated with "_test"
	*/
	#define UNIT_TEST(_name, _flags, _suite) \
	ll_entry_declare(struct unit_test, _name, ut_ ## _suite) = { \
	.file = __FILE__, \
	.name = #_name, \
	.flags = _flags, \
	.func = _name, \
	}

	/* Get the start of a list of unit tests for a particular suite */
	#define UNIT_TEST_SUITE_START(_suite) \
	ll_entry_start(struct unit_test, ut_ ## _suite)
	#define UNIT_TEST_SUITE_COUNT(_suite) \
	ll_entry_count(struct unit_test, ut_ ## _suite)

	/* Use ! and ~ so that all tests will be sorted between these two values */
	#define UNIT_TEST_ALL_START() ll_entry_start(struct unit_test, ut_!)
	#define UNIT_TEST_ALL_END() ll_entry_start(struct unit_test, ut_~)
	#define UNIT_TEST_ALL_COUNT() (UNIT_TEST_ALL_END() - UNIT_TEST_ALL_START())

	/* Sizes for devres tests */
	enum {
	TEST_DEVRES_SIZE = 100,
	TEST_DEVRES_COUNT = 10,
	TEST_DEVRES_TOTAL = TEST_DEVRES_SIZE * TEST_DEVRES_COUNT,

	/* A few different sizes */
	TEST_DEVRES_SIZE2 = 15,
	TEST_DEVRES_SIZE3 = 37,
	};

	/**
	* testbus_get_clear_removed() - Test function to obtain removed device
	*
	* This is used in testbus to find out which device was removed. Calling this
	* function returns a pointer to the device and then clears it back to NULL, so
	* that a future test can check it.
	*/
	struct udevice *testbus_get_clear_removed(void);

	#ifdef CONFIG_SANDBOX
	#include <asm/state.h>
	#include <asm/test.h>
	#endif

	static inline void arch_reset_for_test(void)
	{
	#ifdef CONFIG_SANDBOX
	state_reset_for_test(state_get_current());
	#endif
	}
	static inline int test_load_other_fdt(struct unit_test_state *uts)
	{
	int ret = 0;
	#ifdef CONFIG_SANDBOX
	ret = sandbox_load_other_fdt(&uts->other_fdt, &uts->other_fdt_size);
	#endif
	return ret;
	}

	/**
	* Control skipping of time delays
	*
	* Some tests have unnecessay time delays (e.g. USB). Allow these to be
	* skipped to speed up testing
	*
	* @param skip_delays true to skip delays from now on, false to honour delay
	* requests
	*/
	static inline void test_set_skip_delays(bool skip_delays)
	{
	#ifdef CONFIG_SANDBOX
	state_set_skip_delays(skip_delays);
	#endif
	}

	/**
	* test_set_eth_enable() - Enable / disable Ethernet
	*
	* Allows control of whether Ethernet packets are actually send/received
	*
	* @enable: true to enable Ethernet, false to disable
	*/
	static inline void test_set_eth_enable(bool enable)
	{
	#ifdef CONFIG_SANDBOX
	sandbox_set_eth_enable(enable);
	#endif
	}

	/* Allow ethernet to be disabled for testing purposes */
	static inline bool test_eth_enabled(void)
	{
	bool enabled = true;

	#ifdef CONFIG_SANDBOX
	enabled = sandbox_eth_enabled();
	#endif
	return enabled;
	}

	/* Allow ethernet bootdev to be ignored for testing purposes */
	static inline bool test_eth_bootdev_enabled(void)
	{
	bool enabled = true;

	#ifdef CONFIG_SANDBOX
	enabled = sandbox_eth_enabled();
	#endif
	return enabled;
	}

	#endif /* __TEST_TEST_H */