1. 1823034 dm: Use dm_scan_fdt_dev() directly where possible by Simon Glass · Tue Jul 05 17:10:10 2016 -0600
  2. 3a77be5 test: Generalize the unit test framework by Joe Hershberger · Wed May 20 14:27:27 2015 -0500
  3. 4c70ed9 dm: i2c: Add an explicit test mode to the sandbox I2C driver by Simon Glass · Mon Apr 20 12:37:15 2015 -0600
  4. e4e8ff2 dm: i2c: Add a dm_ prefix to driver model bus speed functions by Simon Glass · Thu Feb 05 21:41:32 2015 -0700
  5. a2723ae dm: i2c: Provide an offset length parameter where needed by Simon Glass · Sun Jan 25 08:26:55 2015 -0700
  6. 7d72276 dm: i2c: Rename driver model I2C functions to permit compatibility by Simon Glass · Mon Jan 12 18:02:07 2015 -0700
  7. 7df766e dm: i2c: Add tests for I2C by Simon Glass · Wed Dec 10 08:55:55 2014 -0700