Log - afb174ac4cb2adfd4448c291fd788c08b47d3db2 - filogic/uboot

ac12a2f dm: treewide: Use uclass_first_device_err when accessing one device by Michal Suchanek · Wed Oct 12 21:57:59 2022 +0200
8e841fb i2c: add dm_i2c_reg_clrset by Sebastian Reichel · Thu Jul 15 17:39:59 2021 +0200
528296f dm: test: Drop assumptions of no sequence numbers by Simon Glass · Wed Dec 16 21:20:13 2020 -0700
974dccd dm: Rename DM test flags to make them more generic by Simon Glass · Tue Jul 28 19:41:12 2020 -0600
75c4d41 dm: core: Drop header files from dm/test.h by Simon Glass · Sun Jul 19 10:15:37 2020 -0600
a3186e6 test: Use ut_asserteq_mem() where possible by Simon Glass · Sun May 10 12:52:45 2020 -0600
f695f6e dm: i2c: EEPROM simulator add tests for addr offset mask by Robert Beckett · Mon Oct 28 17:44:59 2019 +0000
1fe8a49 dm: i2c: EEPROM simulator allow tests visibility of addr and offset by Robert Beckett · Mon Oct 28 17:44:58 2019 +0000
17b56f6 dm: sandbox: i2c: Use new emulator parent uclass by Simon Glass · Sun Nov 18 08:14:34 2018 -0700
10e4779 SPDX: Convert all of our single license tags to Linux Kernel style by Tom Rini · Sun May 06 17:58:06 2018 -0400
1823034 dm: Use dm_scan_fdt_dev() directly where possible by Simon Glass · Tue Jul 05 17:10:10 2016 -0600
3a77be5 test: Generalize the unit test framework by Joe Hershberger · Wed May 20 14:27:27 2015 -0500
4c70ed9 dm: i2c: Add an explicit test mode to the sandbox I2C driver by Simon Glass · Mon Apr 20 12:37:15 2015 -0600
e4e8ff2 dm: i2c: Add a dm_ prefix to driver model bus speed functions by Simon Glass · Thu Feb 05 21:41:32 2015 -0700
a2723ae dm: i2c: Provide an offset length parameter where needed by Simon Glass · Sun Jan 25 08:26:55 2015 -0700
7d72276 dm: i2c: Rename driver model I2C functions to permit compatibility by Simon Glass · Mon Jan 12 18:02:07 2015 -0700
7df766e dm: i2c: Add tests for I2C by Simon Glass · Wed Dec 10 08:55:55 2014 -0700