1. 7df766e dm: i2c: Add tests for I2C by Simon Glass · Wed Dec 10 08:55:55 2014 -0700
  2. 25348a4 dm: sf: Add tests for SPI flash by Simon Glass · Mon Oct 13 23:42:11 2014 -0600
  3. 4071742 dm: Provide a function to scan child FDT nodes by Simon Glass · Wed Jul 23 06:55:18 2014 -0600
  4. db6f020 dm: Introduce device sequence numbering by Simon Glass · Wed Jul 23 06:55:12 2014 -0600
  5. fef72b7 dm: Allow drivers to be marked 'before relocation' by Simon Glass · Wed Jul 23 06:55:03 2014 -0600
  6. a7bb08a dm: Use an explicit expect value in core tests by Simon Glass · Wed Jul 23 06:54:57 2014 -0600
  7. b2c1cac dm: Add basic tests by Simon Glass · Wed Feb 26 15:59:21 2014 -0700