1. cf61f74 dm: test: Add a size to each reg property by Simon Glass · Mon Jul 06 12:54:36 2015 -0600
  2. cd55652 dm: test: Add a test for the system controller uclass by Simon Glass · Mon Jul 06 12:54:35 2015 -0600
  3. d783eb3 dm: test: Add a test for the LED uclass by Simon Glass · Mon Jul 06 12:54:34 2015 -0600
  4. d3e58e4 dm: test: Add a test for the mmc uclass by Simon Glass · Mon Jul 06 12:54:32 2015 -0600
  5. 3d355e6 dm: test: Add a test for the ram uclass by Simon Glass · Mon Jul 06 12:54:31 2015 -0600
  6. d860f22 sandbox: Use the reset driver to handle reset by Simon Glass · Mon Jul 06 12:54:29 2015 -0600
  7. 8cc4d82 dm: test: Add tests for the clk uclass by Simon Glass · Mon Jul 06 12:54:24 2015 -0600
  8. 336b295 sandbox: dts: Add the real-time-clock test nodes back in by Simon Glass · Fri May 22 15:42:17 2015 -0600
  9. 5b96863 sandbox: dts: Sort the test.dts file a little by Simon Glass · Fri May 22 15:42:15 2015 -0600
  10. 77bee05 sandbox: dts: add sandbox_pmic.dtsi and include it to sandbox.dts and test.dts by Przemyslaw Marczak · Wed May 13 13:38:35 2015 +0200
  11. 3dbb55e test: dm: test.dts - move to sandbox dts directory by Przemyslaw Marczak · Wed May 13 13:38:34 2015 +0200[Renamed (93%) from test/dm/test.dts]
  12. c83c4b9 dm: rtc: Add tests for real-time clocks by Simon Glass · Mon Apr 20 12:37:31 2015 -0600
  13. 6b0fb74 dm: test: dts: Sort the aliases in the test device tree file by Simon Glass · Mon Apr 20 12:37:30 2015 -0600
  14. 3168048 dm: usb: Add tests for the USB uclass by Simon Glass · Wed Mar 25 12:23:05 2015 -0600
  15. 279d2f6 dm: eth: Add support for aliases by Joe Hershberger · Sun Mar 22 17:09:16 2015 -0500
  16. 4c19724 test: dm: eth: Add tests for the eth dm implementation by Joe Hershberger · Sun Mar 22 17:09:15 2015 -0500
  17. 3a6eae6 dm: pci: Add driver model tests for PCI by Simon Glass · Thu Mar 05 12:25:34 2015 -0700
  18. 0ccb097 dm: core: Add a flag to control sequence numbering by Simon Glass · Sun Jan 25 08:27:05 2015 -0700
  19. 16e1040 dm: gpio: Add better functions to request GPIOs by Simon Glass · Mon Jan 05 20:05:29 2015 -0700
  20. 7df766e dm: i2c: Add tests for I2C by Simon Glass · Wed Dec 10 08:55:55 2014 -0700
  21. 25348a4 dm: sf: Add tests for SPI flash by Simon Glass · Mon Oct 13 23:42:11 2014 -0600
  22. 4071742 dm: Provide a function to scan child FDT nodes by Simon Glass · Wed Jul 23 06:55:18 2014 -0600
  23. db6f020 dm: Introduce device sequence numbering by Simon Glass · Wed Jul 23 06:55:12 2014 -0600
  24. fef72b7 dm: Allow drivers to be marked 'before relocation' by Simon Glass · Wed Jul 23 06:55:03 2014 -0600
  25. a7bb08a dm: Use an explicit expect value in core tests by Simon Glass · Wed Jul 23 06:54:57 2014 -0600
  26. b2c1cac dm: Add basic tests by Simon Glass · Wed Feb 26 15:59:21 2014 -0700