commit 974dccd3af33e29d3362f7f1160950bcecdc1a3f
author Simon Glass <sjg@chromium.org> Tue Jul 28 19:41:12 2020 -0600
committer Tom Rini <trini@konsulko.com> Fri Aug 07 22:31:32 2020 -0400
tree 9024230dcb1a4f3480cc18a4bed4e965ff406d51
parent dc357ef9054513808b1dae487ff7097061352a4c

dm: Rename DM test flags to make them more generic

The test flags used by driver model are currently not available to other
tests. Rather than creating two sets of flags, make these flags generic
by changing the DM_ prefix to UT_ and moving them to the test.h header.

This will allow adding other test flags without confusion.

Signed-off-by: Simon Glass <sjg@chromium.org>

test/dm/i2c.c

diff --git a/test/dm/i2c.c b/test/dm/i2c.c
index 25b2c7c..681ce45 100644
--- a/test/dm/i2c.c
+++ b/test/dm/i2c.c
@@ -42,7 +42,7 @@
 
 	return 0;
 }
-DM_TEST(dm_test_i2c_find, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
+DM_TEST(dm_test_i2c_find, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
 
 static int dm_test_i2c_read_write(struct unit_test_state *uts)
 {
@@ -59,7 +59,7 @@
 
 	return 0;
 }
-DM_TEST(dm_test_i2c_read_write, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
+DM_TEST(dm_test_i2c_read_write, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
 
 static int dm_test_i2c_speed(struct unit_test_state *uts)
 {
@@ -81,7 +81,7 @@
 
 	return 0;
 }
-DM_TEST(dm_test_i2c_speed, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
+DM_TEST(dm_test_i2c_speed, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
 
 static int dm_test_i2c_offset_len(struct unit_test_state *uts)
 {
@@ -98,7 +98,7 @@
 
 	return 0;
 }
-DM_TEST(dm_test_i2c_offset_len, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
+DM_TEST(dm_test_i2c_offset_len, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
 
 static int dm_test_i2c_probe_empty(struct unit_test_state *uts)
 {
@@ -113,7 +113,7 @@
 
 	return 0;
 }
-DM_TEST(dm_test_i2c_probe_empty, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
+DM_TEST(dm_test_i2c_probe_empty, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
 
 static int dm_test_i2c_bytewise(struct unit_test_state *uts)
 {
@@ -168,7 +168,7 @@
 
 	return 0;
 }
-DM_TEST(dm_test_i2c_bytewise, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
+DM_TEST(dm_test_i2c_bytewise, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
 
 static int dm_test_i2c_offset(struct unit_test_state *uts)
 {
@@ -241,7 +241,7 @@
 
 	return 0;
 }
-DM_TEST(dm_test_i2c_offset, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
+DM_TEST(dm_test_i2c_offset, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
 
 static int dm_test_i2c_addr_offset(struct unit_test_state *uts)
 {
@@ -306,4 +306,4 @@
 	return 0;
 }
 
-DM_TEST(dm_test_i2c_addr_offset, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
+DM_TEST(dm_test_i2c_addr_offset, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);