commit 8ae9f96ee9ca10e72ba40209109e04600a0d6615
author Simon Glass <sjg@chromium.org> Tue Sep 06 20:27:07 2022 -0600
committer Tom Rini <trini@konsulko.com> Thu Sep 29 16:09:56 2022 -0400
tree 00570a7ec4f29d347e0605434eb71d94e61dae84
parent 60f0899aa3e160737fa46a70a8a6b661f4f2c6f3

test: Drop the UT_TESTF_LIVE_OR_FLAT flag

This was a workaround for a rare situation. Now that it will be more
common and we have a proper fix, drop the flag. We can run both types of
tests in the same sandbox executable, even if the flat device tree is
modified.

Signed-off-by: Simon Glass <sjg@chromium.org>

test/dm/ofnode.c

diff --git a/test/dm/ofnode.c b/test/dm/ofnode.c
index 0f65ff9..a421392 100644
--- a/test/dm/ofnode.c
+++ b/test/dm/ofnode.c
@@ -546,10 +546,6 @@
 	struct udevice *dev;
 	ofnode node;
 
-	/* temporarily disable this test due to a failure fixed later */
-	if (!of_live_active())
-		return 0;
-
 	/* Test enabling devices */
 	node = ofnode_path("/usb@2");
 
@@ -588,7 +584,7 @@
 	return 0;
 }
 DM_TEST(dm_test_ofnode_livetree_writing,
-	UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT | UT_TESTF_LIVE_OR_FLAT);
+	UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
 
 static int dm_test_ofnode_u32(struct unit_test_state *uts)
 {
@@ -603,18 +599,13 @@
 
 	return 0;
 }
-DM_TEST(dm_test_ofnode_u32,
-	UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT | UT_TESTF_LIVE_OR_FLAT);
+DM_TEST(dm_test_ofnode_u32, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
 
 static int dm_test_ofnode_add_subnode(struct unit_test_state *uts)
 {
 	ofnode node, check, subnode;
 	char buf[128];
 
-	/* temporarily disable this test due to a failure fixed later */
-	if (!of_live_active())
-		return 0;
-
 	node = ofnode_path("/lcd");
 	ut_assert(ofnode_valid(node));
 	ut_assertok(ofnode_add_subnode(node, "edmund", &subnode));
@@ -677,5 +668,4 @@
 
 	return 0;
 }
-DM_TEST(dm_test_ofnode_add_subnode,
-	UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT | UT_TESTF_LIVE_OR_FLAT);
+DM_TEST(dm_test_ofnode_add_subnode, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);