dm: Provide a function to scan child FDT nodes
At present only root nodes in the device tree are scanned for devices.
But some devices can have children. For example a SPI bus may have
several children for each of its chip selects.
Add a function which scans subnodes and binds devices for each one. This
can be used for the root node scan also, so change it.
A device can call this function in its bind() or probe() methods to bind
its children.
Signed-off-by: Simon Glass <sjg@chromium.org>
diff --git a/test/dm/bus.c b/test/dm/bus.c
new file mode 100644
index 0000000..cfb9934
--- /dev/null
+++ b/test/dm/bus.c
@@ -0,0 +1,63 @@
+/*
+ * Copyright (c) 2014 Google, Inc
+ *
+ * SPDX-License-Identifier: GPL-2.0+
+ */
+
+#include <common.h>
+#include <dm.h>
+#include <dm/root.h>
+#include <dm/test.h>
+#include <dm/ut.h>
+#include <dm/util.h>
+
+DECLARE_GLOBAL_DATA_PTR;
+
+static int testbus_drv_probe(struct udevice *dev)
+{
+ return dm_scan_fdt_node(dev, gd->fdt_blob, dev->of_offset, false);
+}
+
+static const struct udevice_id testbus_ids[] = {
+ {
+ .compatible = "denx,u-boot-test-bus",
+ .data = DM_TEST_TYPE_FIRST },
+ { }
+};
+
+U_BOOT_DRIVER(testbus_drv) = {
+ .name = "testbus_drv",
+ .of_match = testbus_ids,
+ .id = UCLASS_TEST_BUS,
+ .probe = testbus_drv_probe,
+ .priv_auto_alloc_size = sizeof(struct dm_test_priv),
+ .platdata_auto_alloc_size = sizeof(struct dm_test_pdata),
+};
+
+UCLASS_DRIVER(testbus) = {
+ .name = "testbus",
+ .id = UCLASS_TEST_BUS,
+};
+
+/* Test that we can probe for children */
+static int dm_test_bus_children(struct dm_test_state *dms)
+{
+ int num_devices = 4;
+ struct udevice *bus;
+ struct uclass *uc;
+
+ ut_assertok(uclass_get(UCLASS_TEST_FDT, &uc));
+ ut_asserteq(num_devices, list_count_items(&uc->dev_head));
+
+ /* Probe the bus, which should yield 3 more devices */
+ ut_assertok(uclass_get_device(UCLASS_TEST_BUS, 0, &bus));
+ num_devices += 3;
+
+ ut_assertok(uclass_get(UCLASS_TEST_FDT, &uc));
+ ut_asserteq(num_devices, list_count_items(&uc->dev_head));
+
+ ut_assert(!dm_check_devices(dms, num_devices));
+
+ return 0;
+}
+DM_TEST(dm_test_bus_children, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);