diff --git a/drivers/mtd/onenand/onenand_bbt.c b/drivers/mtd/onenand/onenand_bbt.c
index dde11ae..f6092b9 100644
--- a/drivers/mtd/onenand/onenand_bbt.c
+++ b/drivers/mtd/onenand/onenand_bbt.c
@@ -54,7 +54,7 @@
  * @param buf		temporary buffer
  * @param bd		descriptor for the good/bad block search pattern
  * @param chip		create the table for a specific chip, -1 read all chips.
- *              Applies only if NAND_BBT_PERCHIP option is set
+ *		Applies only if NAND_BBT_PERCHIP option is set
  *
  * Create a bad block table by scanning the device
  * for the given good/bad block identify pattern
@@ -102,8 +102,8 @@
 					     bd->offs, &ops);
 
 			/* If it is a initial bad block, just ignore it */
-                        if (ret == ONENAND_BBT_READ_FATAL_ERROR)
-                                return -EIO;
+			if (ret == ONENAND_BBT_READ_FATAL_ERROR)
+				return -EIO;
 
 			if (ret || check_short_pattern
 			    (&buf[j * scanlen], scanlen, mtd->writesize, bd)) {
@@ -156,8 +156,8 @@
 	res = (bbm->bbt[block >> 3] >> (block & 0x06)) & 0x03;
 
 	MTDDEBUG (MTD_DEBUG_LEVEL2,
-	          "onenand_isbad_bbt: bbt info for offs 0x%08x: (block %d) 0x%02x\n",
-	          (unsigned int)offs, block >> 1, res);
+		  "onenand_isbad_bbt: bbt info for offs 0x%08x: (block %d) 0x%02x\n",
+		  (unsigned int)offs, block >> 1, res);
 
 	switch ((int)res) {
 	case 0x00: