sandbox: add ADC unit tests
This commit adds unit tests for ADC uclass's methods using sandbox ADC.
Testing proper ADC binding:
- dm_test_adc_bind() - device binding
- dm_test_adc_wrong_channel_selection() - checking wrong channel selection
Testing ADC supply operations:
- dm_test_adc_supply():
- Vdd/Vss values validating
- Vdd regulator updated value validating
- Vdd regulator's auto enable state validating
Testing ADC operations results:
- dm_test_adc_single_channel_conversion() - single channel start/data
- dm_test_adc_single_channel_shot() - single channel shot
- dm_test_adc_multi_channel_conversion() - multi channel start/data
- dm_test_adc_multi_channel_shot() - multi channel single shot
Signed-off-by: Przemyslaw Marczak <p.marczak@samsung.com>
Cc: Simon Glass <sjg@chromium.org>
Signed-off-by: Minkyu Kang <mk7.kang@samsung.com>
diff --git a/include/power/sandbox_pmic.h b/include/power/sandbox_pmic.h
index 8547674..7fdbfb9 100644
--- a/include/power/sandbox_pmic.h
+++ b/include/power/sandbox_pmic.h
@@ -126,6 +126,10 @@
#define SANDBOX_BUCK1_AUTOSET_EXPECTED_UA 200000
#define SANDBOX_BUCK1_AUTOSET_EXPECTED_ENABLE true
+/* BUCK2: for testing sandbox ADC's supply */
+#define SANDBOX_BUCK2_INITIAL_EXPECTED_UV 3000000
+#define SANDBOX_BUCK2_SET_UV 3300000
+
/* LDO1/2 for testing regulator_list_autoset() */
#define SANDBOX_LDO1_AUTOSET_EXPECTED_UV 1800000
#define SANDBOX_LDO1_AUTOSET_EXPECTED_UA 100000