| # SPDX-License-Identifier: GPL-2.0+ |
| NAND FLASH commands and notes |
| |
| See NOTE below!!! |
| |
| # (C) Copyright 2003 |
| # Dave Ellis, SIXNET, dge@sixnetio.com |
| # |
| |
| Commands: |
| |
| nand bad |
| Print a list of all of the bad blocks in the current device. |
| |
| nand device |
| Print information about the current NAND device. |
| |
| nand device num |
| Make device `num' the current device and print information about it. |
| |
| nand erase off|partition size |
| nand erase clean [off|partition size] |
| Erase `size' bytes starting at offset `off'. Alternatively partition |
| name can be specified, in this case size will be eventually limited |
| to not exceed partition size (this behaviour applies also to read |
| and write commands). Only complete erase blocks can be erased. |
| |
| If `erase' is specified without an offset or size, the entire flash |
| is erased. If `erase' is specified with partition but without an |
| size, the entire partition is erased. |
| |
| If `clean' is specified, a JFFS2-style clean marker is written to |
| each block after it is erased. |
| |
| This command will not erase blocks that are marked bad. There is |
| a debug option in cmd_nand.c to allow bad blocks to be erased. |
| Please read the warning there before using it, as blocks marked |
| bad by the manufacturer must _NEVER_ be erased. |
| |
| nand info |
| Print information about all of the NAND devices found. |
| |
| nand read addr ofs|partition size |
| Read `size' bytes from `ofs' in NAND flash to `addr'. Blocks that |
| are marked bad are skipped. If a page cannot be read because an |
| uncorrectable data error is found, the command stops with an error. |
| |
| nand read.oob addr ofs|partition size |
| Read `size' bytes from the out-of-band data area corresponding to |
| `ofs' in NAND flash to `addr'. This is limited to the 16 bytes of |
| data for one 512-byte page or 2 256-byte pages. There is no check |
| for bad blocks or ECC errors. |
| |
| nand write addr ofs|partition size |
| Write `size' bytes from `addr' to `ofs' in NAND flash. Blocks that |
| are marked bad are skipped. If a page cannot be read because an |
| uncorrectable data error is found, the command stops with an error. |
| |
| As JFFS2 skips blocks similarly, this allows writing a JFFS2 image, |
| as long as the image is short enough to fit even after skipping the |
| bad blocks. Compact images, such as those produced by mkfs.jffs2 |
| should work well, but loading an image copied from another flash is |
| going to be trouble if there are any bad blocks. |
| |
| nand write.trimffs addr ofs|partition size |
| Enabled by the CONFIG_CMD_NAND_TRIMFFS macro. This command will write to |
| the NAND flash in a manner identical to the 'nand write' command |
| described above -- with the additional check that all pages at the end |
| of eraseblocks which contain only 0xff data will not be written to the |
| NAND flash. This behaviour is required when flashing UBI images |
| containing UBIFS volumes as per the UBI FAQ[1]. |
| |
| [1] http://www.linux-mtd.infradead.org/doc/ubi.html#L_flasher_algo |
| |
| nand write.oob addr ofs|partition size |
| Write `size' bytes from `addr' to the out-of-band data area |
| corresponding to `ofs' in NAND flash. This is limited to the 16 bytes |
| of data for one 512-byte page or 2 256-byte pages. There is no check |
| for bad blocks. |
| |
| nand read.raw addr ofs|partition [count] |
| nand write.raw addr ofs|partition [count] |
| Read or write one or more pages at "ofs" in NAND flash, from or to |
| "addr" in memory. This is a raw access, so ECC is avoided and the |
| OOB area is transferred as well. If count is absent, it is assumed |
| to be one page. As with .yaffs2 accesses, the data is formatted as |
| a packed sequence of "data, oob, data, oob, ..." -- no alignment of |
| individual pages is maintained. |
| |
| Configuration Options: |
| |
| CONFIG_SYS_NAND_U_BOOT_OFFS |
| NAND Offset from where SPL will read u-boot image. This is the starting |
| address of u-boot MTD partition in NAND. |
| |
| CONFIG_CMD_NAND |
| Enables NAND support and commands. |
| |
| CONFIG_CMD_NAND_TORTURE |
| Enables the torture command (see description of this command below). |
| |
| CONFIG_SYS_MAX_NAND_DEVICE |
| The maximum number of NAND devices you want to support. |
| |
| CONFIG_SYS_NAND_MAX_ECCPOS |
| If specified, overrides the maximum number of ECC bytes |
| supported. Useful for reducing image size, especially with SPL. |
| This must be at least 48 if nand_base.c is used. |
| |
| CONFIG_SYS_NAND_MAX_OOBFREE |
| If specified, overrides the maximum number of free OOB regions |
| supported. Useful for reducing image size, especially with SPL. |
| This must be at least 2 if nand_base.c is used. |
| |
| CONFIG_SYS_NAND_MAX_CHIPS |
| The maximum number of NAND chips per device to be supported. |
| |
| CONFIG_SYS_NAND_SELF_INIT |
| Traditionally, glue code in drivers/mtd/nand/raw/nand.c has driven |
| the initialization process -- it provides the mtd and nand |
| structs, calls a board init function for a specific device, |
| calls nand_scan(), and registers with mtd. |
| |
| This arrangement does not provide drivers with the flexibility to |
| run code between nand_scan_ident() and nand_scan_tail(), or other |
| deviations from the "normal" flow. |
| |
| If a board defines CONFIG_SYS_NAND_SELF_INIT, drivers/mtd/nand/raw/nand.c |
| will make one call to board_nand_init(), with no arguments. That |
| function is responsible for calling a driver init function for |
| each NAND device on the board, that performs all initialization |
| tasks except setting mtd->name, and registering with the rest of |
| U-Boot. Those last tasks are accomplished by calling nand_register() |
| on the new mtd device. |
| |
| Example of new init to be added to the end of an existing driver |
| init: |
| |
| /* chip is struct nand_chip, and is now provided by the driver. */ |
| mtd = nand_to_mtd(&chip); |
| |
| /* |
| * Fill in appropriate values if this driver uses these fields, |
| * or uses the standard read_byte/write_buf/etc. functions from |
| * nand_base.c that use these fields. |
| */ |
| chip.IO_ADDR_R = ...; |
| chip.IO_ADDR_W = ...; |
| |
| if (nand_scan_ident(mtd, CONFIG_SYS_MAX_NAND_CHIPS, NULL)) |
| error out |
| |
| /* |
| * Insert here any code you wish to run after the chip has been |
| * identified, but before any other I/O is done. |
| */ |
| |
| if (nand_scan_tail(mtd)) |
| error out |
| |
| /* |
| * devnum is the device number to be used in nand commands |
| * and in mtd->name. Must be less than CONFIG_SYS_MAX_NAND_DEVICE. |
| */ |
| if (nand_register(devnum, mtd)) |
| error out |
| |
| In addition to providing more flexibility to the driver, it reduces |
| the difference between a U-Boot driver and its Linux counterpart. |
| nand_init() is now reduced to calling board_nand_init() once, and |
| printing a size summary. This should also make it easier to |
| transition to delayed NAND initialization. |
| |
| Please convert your driver even if you don't need the extra |
| flexibility, so that one day we can eliminate the old mechanism. |
| |
| |
| Platform specific options |
| ========================= |
| CONFIG_NAND_OMAP_GPMC |
| Enables omap_gpmc.c driver for OMAPx and AMxxxx platforms. |
| GPMC controller is used for parallel NAND flash devices, and can |
| do ECC calculation (not ECC error detection) for HAM1, BCH4, BCH8 |
| and BCH16 ECC algorithms. |
| |
| CONFIG_NAND_OMAP_ELM |
| Enables omap_elm.c driver for OMAPx and AMxxxx platforms. |
| ELM controller is used for ECC error detection (not ECC calculation) |
| of BCH4, BCH8 and BCH16 ECC algorithms. |
| Some legacy platforms like OMAP3xx do not have in-built ELM h/w engine, |
| thus such SoC platforms need to depend on software library for ECC error |
| detection. However ECC calculation on such plaforms would still be |
| done by GPMC controller. |
| |
| CONFIG_SPL_NAND_AM33XX_BCH |
| Enables SPL-NAND driver (am335x_spl_bch.c) which supports ELM based |
| hardware ECC correction. This is useful for platforms which have ELM |
| hardware engine and use NAND boot mode. |
| Some legacy platforms like OMAP3xx do not have in-built ELM h/w engine, |
| so those platforms should use CONFIG_SPL_NAND_SIMPLE for enabling |
| SPL-NAND driver with software ECC correction support. |
| |
| CONFIG_NAND_OMAP_ECCSCHEME |
| On OMAP platforms, this CONFIG specifies NAND ECC scheme. |
| It can take following values: |
| OMAP_ECC_HAM1_CODE_SW |
| 1-bit Hamming code using software lib. |
| (for legacy devices only) |
| OMAP_ECC_HAM1_CODE_HW |
| 1-bit Hamming code using GPMC hardware. |
| (for legacy devices only) |
| OMAP_ECC_BCH4_CODE_HW_DETECTION_SW |
| 4-bit BCH code (unsupported) |
| OMAP_ECC_BCH4_CODE_HW |
| 4-bit BCH code (unsupported) |
| OMAP_ECC_BCH8_CODE_HW_DETECTION_SW |
| 8-bit BCH code with |
| - ecc calculation using GPMC hardware engine, |
| - error detection using software library. |
| - requires CONFIG_BCH to enable software BCH library |
| (For legacy device which do not have ELM h/w engine) |
| OMAP_ECC_BCH8_CODE_HW |
| 8-bit BCH code with |
| - ecc calculation using GPMC hardware engine, |
| - error detection using ELM hardware engine. |
| OMAP_ECC_BCH16_CODE_HW |
| 16-bit BCH code with |
| - ecc calculation using GPMC hardware engine, |
| - error detection using ELM hardware engine. |
| |
| How to select ECC scheme on OMAP and AMxx platforms ? |
| ----------------------------------------------------- |
| Though higher ECC schemes have more capability to detect and correct |
| bit-flips, but still selection of ECC scheme is dependent on following |
| - hardware engines present in SoC. |
| Some legacy OMAP SoC do not have ELM h/w engine thus such |
| SoC cannot support BCHx_HW ECC schemes. |
| - size of OOB/Spare region |
| With higher ECC schemes, more OOB/Spare area is required to |
| store ECC. So choice of ECC scheme is limited by NAND oobsize. |
| |
| In general following expression can help: |
| NAND_OOBSIZE >= 2 + (NAND_PAGESIZE / 512) * ECC_BYTES |
| where |
| NAND_OOBSIZE = number of bytes available in |
| OOB/spare area per NAND page. |
| NAND_PAGESIZE = bytes in main-area of NAND page. |
| ECC_BYTES = number of ECC bytes generated to |
| protect 512 bytes of data, which is: |
| 3 for HAM1_xx ecc schemes |
| 7 for BCH4_xx ecc schemes |
| 14 for BCH8_xx ecc schemes |
| 26 for BCH16_xx ecc schemes |
| |
| example to check for BCH16 on 2K page NAND |
| NAND_PAGESIZE = 2048 |
| NAND_OOBSIZE = 64 |
| 2 + (2048 / 512) * 26 = 106 > NAND_OOBSIZE |
| Thus BCH16 cannot be supported on 2K page NAND. |
| |
| However, for 4K pagesize NAND |
| NAND_PAGESIZE = 4096 |
| NAND_OOBSIZE = 224 |
| ECC_BYTES = 26 |
| 2 + (4096 / 512) * 26 = 210 < NAND_OOBSIZE |
| Thus BCH16 can be supported on 4K page NAND. |
| |
| |
| CONFIG_NAND_OMAP_GPMC_PREFETCH |
| On OMAP platforms that use the GPMC controller |
| (CONFIG_NAND_OMAP_GPMC_PREFETCH), this options enables the code that |
| uses the prefetch mode to speed up read operations. |
| |
| NOTE: |
| ===== |
| |
| The Disk On Chip driver is currently broken and has been for some time. |
| There is a driver in drivers/mtd/nand/raw, taken from Linux, that works with |
| the current NAND system but has not yet been adapted to the u-boot |
| environment. |
| |
| Additional improvements to the NAND subsystem by Guido Classen, 10-10-2006 |
| |
| JFFS2 related commands: |
| |
| implement "nand erase clean" and old "nand erase" |
| using both the new code which is able to skip bad blocks |
| "nand erase clean" additionally writes JFFS2-cleanmarkers in the oob. |
| |
| Miscellaneous and testing commands: |
| "markbad [offset]" |
| create an artificial bad block (for testing bad block handling) |
| |
| "scrub [offset length]" |
| like "erase" but don't skip bad block. Instead erase them. |
| DANGEROUS!!! Factory set bad blocks will be lost. Use only |
| to remove artificial bad blocks created with the "markbad" command. |
| |
| "torture offset [size]" |
| Torture block to determine if it is still reliable. |
| Enabled by the CONFIG_CMD_NAND_TORTURE configuration option. |
| This command returns 0 if the block is still reliable, else 1. |
| If the block is detected as unreliable, it is up to the user to decide to |
| mark this block as bad. |
| The analyzed block is put through 3 erase / write cycles (or less if the block |
| is detected as unreliable earlier). |
| This command can be used in scripts, e.g. together with the markbad command to |
| automate retries and handling of possibly newly detected bad blocks if the |
| nand write command fails. |
| It can also be used manually by users having seen some NAND errors in logs to |
| search the root cause of these errors. |
| The underlying nand_torture() function is also useful for code willing to |
| automate actions following a nand->write() error. This would e.g. be required |
| in order to program or update safely firmware to NAND, especially for the UBI |
| part of such firmware. |
| Optionally, a second parameter size can be given to test multiple blocks with |
| one call. If size is not a multiple of the NAND's erase size, then the block |
| that contains offset + size will be tested in full. If used with size, this |
| command returns 0 if all tested blocks have been found reliable, else 1. |
| |
| |
| NAND locking command (for chips with active LOCKPRE pin) |
| |
| "nand lock" |
| set NAND chip to lock state (all pages locked) |
| |
| "nand lock tight" |
| set NAND chip to lock tight state (software can't change locking anymore) |
| |
| "nand lock status" |
| displays current locking status of all pages |
| |
| "nand unlock [offset] [size]" |
| unlock consecutive area (can be called multiple times for different areas) |
| |
| "nand unlock.allexcept [offset] [size]" |
| unlock all except specified consecutive area |
| |
| I have tested the code with board containing 128MiB NAND large page chips |
| and 32MiB small page chips. |