commit 1a92f83c87e39d0d372e37ab8219862fd9bcc2b6
author Simon Glass <sjg@chromium.org> Thu Aug 22 07:57:48 2024 -0600
committer Tom Rini <trini@konsulko.com> Mon Aug 26 18:51:48 2024 -0600
tree ea7305492e3b2c4c8e4887eabe7e7e273e7c8f55
parent c2e59eb50c8312b1a4380060fb3cdfce97e62f55

test: Rename unit-test flags

The UT_TESTF_ macros read as 'unit test test flags' which is not right.
Rename to UTF ('unit test flags').

This has the benefit of being shorter, which helps keep UNIT_TEST()
declarations on a single line.

Give the enum a name and reference it from the UNIT_TEST() macros while
we are here.

Signed-off-by: Simon Glass <sjg@chromium.org>

test/dm/i2c.c

diff --git a/test/dm/i2c.c b/test/dm/i2c.c
index e9cf9f7..50a2cd0 100644
--- a/test/dm/i2c.c
+++ b/test/dm/i2c.c
@@ -38,7 +38,7 @@
 
 	return 0;
 }
-DM_TEST(dm_test_i2c_find, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_i2c_find, UTF_SCAN_PDATA | UTF_SCAN_FDT);
 
 static int dm_test_i2c_read_write(struct unit_test_state *uts)
 {
@@ -55,7 +55,7 @@
 
 	return 0;
 }
-DM_TEST(dm_test_i2c_read_write, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_i2c_read_write, UTF_SCAN_PDATA | UTF_SCAN_FDT);
 
 static int dm_test_i2c_speed(struct unit_test_state *uts)
 {
@@ -77,7 +77,7 @@
 
 	return 0;
 }
-DM_TEST(dm_test_i2c_speed, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_i2c_speed, UTF_SCAN_PDATA | UTF_SCAN_FDT);
 
 static int dm_test_i2c_offset_len(struct unit_test_state *uts)
 {
@@ -94,7 +94,7 @@
 
 	return 0;
 }
-DM_TEST(dm_test_i2c_offset_len, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_i2c_offset_len, UTF_SCAN_PDATA | UTF_SCAN_FDT);
 
 static int dm_test_i2c_probe_empty(struct unit_test_state *uts)
 {
@@ -109,7 +109,7 @@
 
 	return 0;
 }
-DM_TEST(dm_test_i2c_probe_empty, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_i2c_probe_empty, UTF_SCAN_PDATA | UTF_SCAN_FDT);
 
 static int dm_test_i2c_bytewise(struct unit_test_state *uts)
 {
@@ -164,7 +164,7 @@
 
 	return 0;
 }
-DM_TEST(dm_test_i2c_bytewise, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_i2c_bytewise, UTF_SCAN_PDATA | UTF_SCAN_FDT);
 
 static int dm_test_i2c_offset(struct unit_test_state *uts)
 {
@@ -237,7 +237,7 @@
 
 	return 0;
 }
-DM_TEST(dm_test_i2c_offset, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_i2c_offset, UTF_SCAN_PDATA | UTF_SCAN_FDT);
 
 static int dm_test_i2c_addr_offset(struct unit_test_state *uts)
 {
@@ -302,7 +302,7 @@
 	return 0;
 }
 
-DM_TEST(dm_test_i2c_addr_offset, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_i2c_addr_offset, UTF_SCAN_PDATA | UTF_SCAN_FDT);
 
 static int dm_test_i2c_reg_clrset(struct unit_test_state *uts)
 {
@@ -331,4 +331,4 @@
 
 	return 0;
 }
-DM_TEST(dm_test_i2c_reg_clrset, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_i2c_reg_clrset, UTF_SCAN_PDATA | UTF_SCAN_FDT);