test: Rename unit-test flags
The UT_TESTF_ macros read as 'unit test test flags' which is not right.
Rename to UTF ('unit test flags').
This has the benefit of being shorter, which helps keep UNIT_TEST()
declarations on a single line.
Give the enum a name and reference it from the UNIT_TEST() macros while
we are here.
Signed-off-by: Simon Glass <sjg@chromium.org>
diff --git a/test/dm/acpigen.c b/test/dm/acpigen.c
index 7113219..3e912fa 100644
--- a/test/dm/acpigen.c
+++ b/test/dm/acpigen.c
@@ -167,7 +167,7 @@
return 0;
}
-DM_TEST(dm_test_acpi_interrupt, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_acpi_interrupt, UTF_SCAN_PDATA | UTF_SCAN_FDT);
/* Test emitting a GPIO descriptor */
static int dm_test_acpi_gpio(struct unit_test_state *uts)
@@ -212,7 +212,7 @@
return 0;
}
-DM_TEST(dm_test_acpi_gpio, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_acpi_gpio, UTF_SCAN_PDATA | UTF_SCAN_FDT);
/* Test emitting a GPIO descriptor with an interrupt */
static int dm_test_acpi_gpio_irq(struct unit_test_state *uts)
@@ -257,7 +257,7 @@
return 0;
}
-DM_TEST(dm_test_acpi_gpio_irq, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_acpi_gpio_irq, UTF_SCAN_PDATA | UTF_SCAN_FDT);
/* Test emitting either a GPIO or interrupt descriptor */
static int dm_test_acpi_interrupt_or_gpio(struct unit_test_state *uts)
@@ -296,8 +296,7 @@
return 0;
}
-DM_TEST(dm_test_acpi_interrupt_or_gpio,
- UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_acpi_interrupt_or_gpio, UTF_SCAN_PDATA | UTF_SCAN_FDT);
/* Test emitting an I2C descriptor */
static int dm_test_acpi_i2c(struct unit_test_state *uts)
@@ -329,7 +328,7 @@
return 0;
}
-DM_TEST(dm_test_acpi_i2c, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_acpi_i2c, UTF_SCAN_PDATA | UTF_SCAN_FDT);
/* Test emitting a SPI descriptor */
static int dm_test_acpi_spi(struct unit_test_state *uts)
@@ -365,7 +364,7 @@
return 0;
}
-DM_TEST(dm_test_acpi_spi, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_acpi_spi, UTF_SCAN_PDATA | UTF_SCAN_FDT);
/* Test emitting a length */
static int dm_test_acpi_len(struct unit_test_state *uts)
@@ -806,7 +805,7 @@
return 0;
}
-DM_TEST(dm_test_acpi_gpio_toggle, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_acpi_gpio_toggle, UTF_SCAN_PDATA | UTF_SCAN_FDT);
/* Test writing ACPI code to output power-sequence info */
static int dm_test_acpi_power_seq(struct unit_test_state *uts)
@@ -873,7 +872,7 @@
return 0;
}
-DM_TEST(dm_test_acpi_power_seq, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_acpi_power_seq, UTF_SCAN_PDATA | UTF_SCAN_FDT);
/* Test writing values */
static int dm_test_acpi_write_values(struct unit_test_state *uts)
@@ -947,7 +946,7 @@
return 0;
}
-DM_TEST(dm_test_acpi_scope, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
+DM_TEST(dm_test_acpi_scope, UTF_SCAN_PDATA | UTF_SCAN_FDT);
/* Test writing a resource template */
static int dm_test_acpi_resource_template(struct unit_test_state *uts)